H. Gnaser : rechercher sur Z-Library

Année:

1993

Langue:

english

Fichier:

PDF, 624 KB

english, 1993

Carbon depth distribution in spin-on silicon dioxide films

N.V. Gaponenko, H. Gnaser, P. Becker, V.A. Grozhik

Journal:

Année:

1995

Langue:

english

Fichier:

PDF, 675 KB

english, 1995

A search for doubly charged negative cluster ions in sputtering

Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Journal:

Année:

1993

Langue:

english

Fichier:

PDF, 399 KB

english, 1993

Isotopic mass effects in low-energy sputtering of copper and molybdenum

W. Bieck, H. Gnaser, H. Oechsner

Journal:

Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Année:

1995

Langue:

english

Fichier:

PDF, 854 KB

english, 1995

Velocity-dependent isotope fractionation in secondary-ion emission

Gnaser, H., Hutcheon, I. D.

Journal:

Physical Review B

Année:

1987

Langue:

english

Fichier:

PDF, 126 KB

english, 1987

Yields and composition changes in low-energy sputtering of binary alloys: Experiments and computer simulations

Gnaser, H., Oechsner, H.

Journal:

Physical Review B

Année:

1993

Langue:

english

Fichier:

PDF, 412 KB

english, 1993

Significance of isotope effects for secondary-ion emission models

Gnaser, H., Hutcheon, I. D.

Journal:

Physical Review B

Année:

1988

Langue:

english

Fichier:

PDF, 275 KB

english, 1988

Towards a 3D Characterization of Solids by MCs+ SIMS

Gnaser, Hubert

Journal:

Année:

1996

Langue:

english

Fichier:

PDF, 854 KB

english, 1996

SIMS Detection in the 1012 Atoms cm-3 Range

Gnaser, Hubert

Journal:

Année:

1997

Langue:

english

Fichier:

PDF, 239 KB

english, 1997

Secondary-neutral and secondary-ion mass spectrometry analysis of TiN-based hard coatings: an assessment of quantification procedures

W. Bock, H. Gnaser, H. Oechsner

Journal:

Analytica Chimica Acta

Année:

1994

Langue:

english

Fichier:

PDF, 746 KB

english, 1994

Strong 1.54 μm luminescence from erbium-doped porous silicon

A Dorofeev, E Bachilo, V Bondarenko, N Gaponenko, N Kazuchits, A Leshok, G Troyanova, N Vorozov, V Borisenko, H Gnaser, W Bock, P Becker, H Oechsner

Journal:

Année:

1996

Langue:

english

Fichier:

PDF, 429 KB

english, 1996

Negative secondary ion emission from oxidized surfaces

Journal:

Surface Science Letters

Année:

1984

Langue:

english

Fichier:

PDF, 56 KB

english, 1984

Angle-integrated yields of neutral clusters in low-energy sputtering of nickel and copper

H. Gnaser, F.G. Rüdenauer

Journal:

Surface Science Letters

Année:

1991

Langue:

english

Fichier:

PDF, 69 KB

english, 1991

Modification of crystalline semiconductor surfaces by low-energy Ar+ bombardment: Si(111) and Ge(100)

W. Bock, H. Gnaser, H. Oechsner

Journal:

Surface Science Letters

Année:

1993

Langue:

english

Fichier:

PDF, 76 KB

english, 1993

Evaluation of a liquid metal ion source for secondary ion mass spectrometry

Journal:

Nuclear Instruments and Methods in Physics Research

Année:

1983

Langue:

english

Fichier:

PDF, 275 KB

english, 1983

Oxygen-concentration dependent enhancement of positive secondary ion emission from silicon

Nuclear Instruments and Methods in Physics Research

Journal:

Année:

1983

Langue:

english

Fichier:

PDF, 278 KB

english, 1983

Evidence of bond-breaking processes in sputtered ion emission

International Journal of Mass Spectrometry and Ion Processes

Journal:

Année:

1984

Langue:

english

Fichier:

PDF, 410 KB

english, 1984

Comparative SIMS and SNMS analyses of amorphous semiconductor thin films

H. Gnaser, W. Bock, H. Oechsner, T.K. Bhattacharayya

Journal:

Année:

1993

Langue:

english

Fichier:

PDF, 371 KB

english, 1993

Processes in low-energy ion-surface collisions: preferential sputtering, defect and adatom formation

Journal:

Adam Orendorz, Jens Wüsten, Christiane Ziegler, Hubert Gnaser

Année:

1996

Langue:

english

Fichier:

PDF, 1.20 MB

english, 1996

Photoelectron spectroscopy of nanocrystalline anatase TiO2 films

Journal:

Année:

2005

Langue:

english

Fichier:

PDF, 145 KB

english, 2005

Strong composition-dependent variation of MCs+ calibration factors in TiOx and GeOx (x ≤ 2) films

Hubert Gnaser, Yongkang Le, Weifeng Su

Journal:

Hubert Gnaser, Adam Orendorz, Christiane Ziegler, Elisabeth Rowlett, Wolfgang Bock

Année:

2006

Langue:

english

Fichier:

PDF, 216 KB

english, 2006

TOF-SIMS study of photocatalytic decomposition reactions on nanocrystalline TiO2 films

Journal:

Année:

2006

Langue:

english

Fichier:

PDF, 206 KB

english, 2006

Incidence-angle dependent Cs incorporation in Si during low-energy bombardment: A dynamic computer simulation study

Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Journal:

Année:

2009

Langue:

english

Fichier:

PDF, 334 KB

english, 2009

Cs incorporation in semiconductors during low-energy bombardment: A dynamic computer simulation study

Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Journal:

Année:

2009

Langue:

english

Fichier:

PDF, 615 KB

english, 2009

Energy spectra of sputtered positive ions under Cs+ bombardment

Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Journal:

Année:

2011

Langue:

english

Fichier:

PDF, 1.30 MB

english, 2011

Secondary ion emission from transition metals during exposure to oxygen and subsequent sputtering

Applications of Surface Science

Journal:

Année:

1984

Langue:

english

Fichier:

PDF, 474 KB

english, 1984

Detection of sputtered molecular doubly charged anions: a comparison of secondary-ion mass spectrometry (SIMS) and accelerator mass spectrometry (AMS)

Hubert Gnaser, Robin Golser, Walter Kutschera, Alfred Priller, Peter Steier, Christof Vockenhuber

Journal:

Hubert Gnaser, Robin Golser

Année:

2004

Langue:

english

Fichier:

PDF, 134 KB

english, 2004

Sputtered gas-phase dianions detected by high-sensitivity mass spectrometry

Journal:

Chemical Physics

Année:

2006

Langue:

english

Fichier:

PDF, 380 KB

english, 2006

Erratum to: “Secondary-ion mass spectrometry (SIMS) analysis of catalyst coatings used in microreactors” [Nucl. Instr. and Meth. B 219–220 (2004) 880–885]

Hubert Gnaser, Wolfgang Bock, Elisabeth Rowlett, Yong Men, Christiane Ziegler, Ralf Zapf, Volker Hessel

Journal:

Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Année:

2004

Langue:

english

Fichier:

PDF, 339 KB

english, 2004

Accelerator mass spectrometry of molecular ions

Robin Golser, Hubert Gnaser, Walter Kutschera, Alfred Priller, Peter Steier, Christof Vockenhuber, Anton Wallner

Journal:

Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Année:

2005

Langue:

english

Fichier:

PDF, 189 KB

english, 2005

Electrical properties of nanocrystalline anatase TiO2 thin films with different crystallite size

Bernd Huber, Hubert Gnaser, Christiane Ziegler

Journal:

Surface Science

Année:

2004

Langue:

english

Fichier:

PDF, 351 KB

english, 2004

Structural transformations in nanocrystalline anatase TiO2 films upon annealing in air

A. Orendorz, A. Brodyanski, J. Lösch, L.H. Bai, Z.H. Chen, Y.K. Le, C. Ziegler, H. Gnaser

Journal:

Surface Science

Année:

2006

Langue:

english

Fichier:

PDF, 267 KB

english, 2006

Phase transformation and particle growth in nanocrystalline anatase TiO2 films analyzed by X-ray diffraction and Raman spectroscopy

A. Orendorz, A. Brodyanski, J. Lösch, L.H. Bai, Z.H. Chen, Y.K. Le, C. Ziegler, H. Gnaser

Journal:

Surface Science

Année:

2007

Langue:

english

Fichier:

PDF, 313 KB

english, 2007

Nanocrystalline anatase TiO2 thin films: preparation and crystallite size-dependent properties

Bernd Huber, Alexander Brodyanski, Michael Scheib, Adam Orendorz, Christiane Ziegler, Hubert Gnaser

Journal:

Année:

2005

Langue:

english

Fichier:

PDF, 934 KB

english, 2005

Sputtering of Cs-carrying diatomic cations from surfaces by keV Cs+ irradiation

International Journal of Mass Spectrometry and Ion Processes

Journal:

Année:

1998

Langue:

english

Fichier:

PDF, 720 KB

english, 1998

Ionization probability of sputtered cluster anions: Cn− and Sin−

Journal:

Année:

2003

Langue:

english

Fichier:

PDF, 113 KB

english, 2003

Parts-per-billion detection with electron-gas secondary-neutral mass spectrometry

H. Gnaser, H. Oechsner, H.-J. Schneider

Journal:

Hubert Gnaser, Jörg Lösch, Adam Orendorz, Christiane Ziegler

Année:

1997

Langue:

english

Fichier:

PDF, 319 KB

english, 1997

Temperature-dependent grain growth and phase transformation in mixed anatase-rutile nanocrystalline TiO2 films

Journal:

physica status solidi (a)

Année:

2011

Langue:

english

Fichier:

PDF, 266 KB

english, 2011

Structural investigation of pristine and annealed nanocrystalline TiO2 thin films by X-ray diffraction and Raman spectroscopy

A. Orendorz, A. Brodyanski, J. Lösch, L. H. Bai, Z. H. Chen, Y. K. Le, C. Ziegler, H. Gnaser

Journal:

physica status solidi (c)

Année:

2007

Langue:

english

Fichier:

PDF, 306 KB

english, 2007

Strongly reduced fragmentation and soft emission processes in sputtered ion formation from amino acid films under large Arn+ (n ≤ 2200) cluster ion bombardment

Hubert Gnaser, Kazuya Ichiki, Jiro Matsuo

Journal:

Rapid Communications in Mass Spectrometry

Année:

2012

Langue:

english

Fichier:

PDF, 816 KB

english, 2012

Focused ion beam implantation of Ga in Si and Ge: fluence-dependent retention and surface morphology

Hubert Gnaser, Alexander Brodyanski, Bernhard Reuscher

Journal:

Année:

2008

Langue:

english

Fichier:

PDF, 373 KB

english, 2008

Dynamic computer simulations of Cs incorporation in Si during low-energy (0.2–3 keV) irradiation

Journal:

Année:

2008

Langue:

english

Fichier:

PDF, 228 KB

english, 2008

Focused ion beam implantation of Ga in InP studied by SIMS and dynamic computer simulations

Journal:

Hubert Gnaser, Robin Golser

Année:

2011

Langue:

english

Fichier:

PDF, 133 KB

english, 2011

Sputtered molecular fluoride anions: HfFn− and WFn−

Journal:

Année:

2011

Langue:

english

Fichier:

PDF, 124 KB

english, 2011

Energy spectra of sputtered ions: assessment of the instrumental resolution

Journal:

Hubert Gnaser, Kazuya Ichiki, Jiro Matsuo

Année:

2012

Langue:

english

Fichier:

PDF, 570 KB

english, 2012

Sputtered ion emission under size-selected Arn+ cluster ion bombardment

Journal:

Année:

2012

Langue:

english

Fichier:

PDF, 365 KB

english, 2012

Noval detection scheme for the analysis of hydrogen and helium by secondary ion mass spectrometry

Journal:

Année:

1991

Langue:

english

Fichier:

PDF, 289 KB

english, 1991

Emission of MCs+ secondary ions from semiconductors by caesium bombardment

Journal: